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ZEISS Xradia 620 Versa X-ray microscope
ZEISS Xradia 620 Versa X-ray microscope
ZEISS Xradia 620 Versa can non-destructively characterize the 3D microstructure of materials under controlled perturbations (in situ), and observe the evolution of structures over time (4D). By leveraging Resolution at … Read More Read More
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Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy (SEM) is a test process that scans a sample with an electron beam to produce a magnified image for analysis. The method is also known as SEM analysis … Read More Read More
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